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Atomic Force Microscopy
Peter Eaton and Paul West
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150 b/w line and halftone illustrations, 9 colour figures
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246x171mm
978-0-19-957045-4
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Hardback
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25 March 2010
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- A very practical guide to Atomic Force Microscopy
- Authors have unique insight into the field
- Combination in one book of theory, practice and application of AFM
- Very up-to-date with latest techniques such as multifrequency AFM, high speed AFM, small cantilevers, etc.
- Insight on how instrumental design influences performance, and instrument use
- Section on how to recognise, and avoid, AFM artifacts
- Examples of AFM application in physical sciences, materials science, life sciences, nanotechnology and industry
Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs
and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.Readership: Industrial users of Atomic Force Microscopy. University researchers using AFM (students in undergraduate and postgraduate degrees, and post doctoral researchers and professors). Both teachers and students in courses involving AFM, especially nanotechnology courses.
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Peter Eaton, Chemistry Department, University of Porto, Portugal, and Paul West, Pacific NanoTechnology, California
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"i Atomic Force Microscopy r is a great introduction to AFMs for beginners and, although light on theory, also serves as a good starting point for more serious users." - Udo D. Schwarz, Physics Today
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1: Introduction
2: Instrumental Aspects of AFM
3: AFM Modes
4: Measuring AFM Images
5: Image Processing in AFM
6: Image Artifacts in AFM
7: Applications of AFM
Appendix 1: AFM Standards and Calibration Specimens
Appendix 2: AFM Software
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The specification in this catalogue, including without limitation price, format, extent, number of illustrations, and month of publication, was as accurate as possible at the time the catalogue was compiled. Occasionally, due to the nature of some contractual restrictions, we are unable to ship a specific product to a particular territory. Jacket images are provisional and liable to change before publication.
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